DocumentCode :
2069679
Title :
Within-clock power gating architecture implimentation to reduce leakage
Author :
Pradhan, S.N. ; Choudhury, Pallab ; Nath, Dipen ; Nag, Avishek
Author_Institution :
Dept. of ECE, NIT Agartala, Agartala, India
fYear :
2012
fDate :
17-19 Dec. 2012
Firstpage :
1
Lastpage :
4
Abstract :
With the technology scaling leakage power has become comparable to dynamic power. Power gating is a technique which is used to reduce standby leakage by shutting down the power supply of the inactive block of the circuit. There is also scope of using power gating in active block to reduce run time leakage. Within clock period there is certain portion which is idle and in this period power gating may be used. In this paper we present this within-clock power gating for minimizing leakage and total power of the sequential circuits during active mode of operation. The technique is used to implement the architecture of ISCAS89 benchmark circuit. Power results have been reported for different frequency. Simulation of the implemented architecture in CADENCE VLSI tool at 45nm technology shows leakage saving of 73% and 54.78% saving in switching compared to the designs without within-clock power gating at 1.25 MHZ.
Keywords :
VLSI; clocks; leakage currents; power supply circuits; scaling circuits; sequential circuits; CADENCE VLSI tool; ISCAS89 benchmark circuit; clock period; dynamic power; frequency 1.25 MHz; inactive block; leakage reduction; power supply; run time leakage; sequential circuits; size 45 nm; standby leakage; technology scaling leakage power; within-clock power gating architecture; architecture; isolation; leakage; power gating; within-clock;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers and Devices for Communication (CODEC), 2012 5th International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4673-2619-3
Type :
conf
DOI :
10.1109/CODEC.2012.6509269
Filename :
6509269
Link To Document :
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