DocumentCode :
2069819
Title :
Chip On Board packaging of light emitting diodes and thermal characterizations
Author :
Labau, Sebastien ; Picard, Nicolas ; Gasse, Adrien ; Bernabe, Stéphane ; Grosse, Philippe ; Ribot, Hervé
Author_Institution :
CEA, LETI, Grenoble
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
848
Lastpage :
853
Abstract :
High Brightness Light-Emitting Diodes (HB-LEDs) are key devices for the solid state lighting applications. Nowadays, thermal management in LEDs packaging is one of the bottlenecks preventing a wide use of HB-LEDs in lighting systems. Thermal conduction has to be addressed at all levels of packaging but the issue at the chip or device level is the most critical to keep the junction temperature as low as possible. Chip On Board (COB) technology is a way of integrating chips directly onto the board which is very promising since it enables achieving a better miniaturization and a design flexibility. In addition, in the case of LEDs packaging, a better and efficient thermal management is expected since the total thermal resistance can be greatly reduced. In this paper, we present a detailed study of the thermal resistances in COB package technologies. The thermal resistance is derived from thermo-electrical and optical measurements allowing determination of the junction temperature and dissipated power. The measured thermal resistance in COB technology is compared to a classical surface mounting of packaged LEDs exhibiting a peculiar behavior for the former. These measurements are supported by a computed thermal analysis using the ANSYSTM software to discuss the results.
Keywords :
chip-on-board packaging; heat conduction; light emitting diodes; thermal management (packaging); chip on board packaging; high brightness light-emitting diodes; light emitting diodes; solid state lighting applications; thermal characterizations; thermal conduction; thermal management; Brightness; Electrical resistance measurement; LED lamps; Light emitting diodes; Packaging; Solid state lighting; Surface resistance; Temperature; Thermal management; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074111
Filename :
5074111
Link To Document :
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