DocumentCode :
2070103
Title :
Image segmentation based on modified information cut in wavelet domain
Author :
Fu, Huijing ; Tian, Zheng ; He, Chengbin ; Ran, Maohua
Author_Institution :
Dept. of Appl. Math., Polytech. Univ., Xi´´an, China
fYear :
2011
fDate :
14-16 Sept. 2011
Firstpage :
1
Lastpage :
4
Abstract :
To solve the mis-clusters caused by the traditional information cut algorithm when it is applied to segment images with gray changes, modified information cut in wavelet domain (W-MIC) algorithm is proposed. First, using the gray relevance and space relevance between image pixels, a modified information cut (MIC) is presented, which utilizes a new Parzen windowing function to evaluate probability density functions, and reduces the effect of gray changes to image segmentation; further, considering the difficulties of selecting the optimal parameter in MIC, the proposed W-MIC can reduce the complexity of parameter selection via the smoothing role of wavelet, and improve segmentation results by fusing low frequency information and high frequency information derived from undecimated wavelet decomposition. Segmentation experiments demonstrate that it effectively decreases the influence of parameters selection, and it can not only avoid the mis-clusters caused by gray changes, but also keep image edges.
Keywords :
image segmentation; smoothing methods; wavelet transforms; Parzen windowing function; gray changes; gray relevance; high frequency information; image pixels; image segmentation; low frequency information; mis-clusters; modified information cut; parameter selection; probability density functions; smoothing role; space relevance; undecimated wavelet decomposition; wavelet domain; Clustering algorithms; Image edge detection; Image segmentation; Microwave integrated circuits; Noise; Wavelet transforms; Parzen windowing; image segmentation; information cut; undecimated wavelet transformation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing, Communications and Computing (ICSPCC), 2011 IEEE International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-0893-0
Type :
conf
DOI :
10.1109/ICSPCC.2011.6061808
Filename :
6061808
Link To Document :
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