Title :
IC emission spectrum drifts after burn-in cycles
Author :
Dhia, S. Ben ; Ndoye, A.C. ; Boyer, A. ; Guillot, L. ; Vrignon, Bertrand
Author_Institution :
INSA, LATTIS,, Univ. of Toulouse, Toulouse
Abstract :
As device lifetime tends to decrease with CMOS nanometric technologies, new degradation mechanisms at device level could involve a drift in IC electromagnetic behavior. This paper presents the evolution of emission spectrum of a mixed component for automotive applications after accelerated ageing. We explore the link between degradation mechanisms of electrical parameters and the drift of the component emission spectrum.
Keywords :
CMOS integrated circuits; ageing; automotive electronics; integrated circuits; CMOS nanometric technologies; accelerated ageing; automotive applications; burn-in cycles; electromagnetic behavior; integrated circuit emission; spectrum drifts; Bonding; Electromagnetic compatibility; Variable structure systems; Voltage;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559860
