• DocumentCode
    2070264
  • Title

    IC emission spectrum drifts after burn-in cycles

  • Author

    Dhia, S. Ben ; Ndoye, A.C. ; Boyer, A. ; Guillot, L. ; Vrignon, Bertrand

  • Author_Institution
    INSA, LATTIS,, Univ. of Toulouse, Toulouse
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    255
  • Lastpage
    258
  • Abstract
    As device lifetime tends to decrease with CMOS nanometric technologies, new degradation mechanisms at device level could involve a drift in IC electromagnetic behavior. This paper presents the evolution of emission spectrum of a mixed component for automotive applications after accelerated ageing. We explore the link between degradation mechanisms of electrical parameters and the drift of the component emission spectrum.
  • Keywords
    CMOS integrated circuits; ageing; automotive electronics; integrated circuits; CMOS nanometric technologies; accelerated ageing; automotive applications; burn-in cycles; electromagnetic behavior; integrated circuit emission; spectrum drifts; Bonding; Electromagnetic compatibility; Variable structure systems; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559860
  • Filename
    4559860
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2070264