Title :
Application of GTEM cells for IC EMC testing
Author :
Heinrich, Ralf ; Mullerwiebus, V. ; Lange, Andreas ; Deutschmann, Bernd ; Karsten, Uwe ; Klotz, Frank
Author_Institution :
Teseq GmbH, Berlin
Abstract :
A test object for investigation and comparison of different IC EMC test facilities (muTEM and GTEM cell) has been designed. The test board allows the characterization of the test facility directly at the position of the EUT. Based on this test object the DUT orientation and test facility requirements are investigated theoretically and experimentally. The comparison of muTEM cells and a GTEM cell showed a good agreement of the measurement results up to the frequency limitations of the muTEM cells.
Keywords :
TEM cells; electromagnetic compatibility; integrated circuit testing; test facilities; DUT; EUT; GTEM cells; IC EMC testing; test facilities; Application specific integrated circuits; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic measurements; Frequency measurement; Integrated circuit testing; Loss measurement; TEM cells; Test facilities;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559862
