DocumentCode :
2070455
Title :
Additives participation in Cu6Sn5 phase formed between Sn-3.5Ag solder and Cu by first-principle approach
Author :
Gao, Feng ; Qu, Jianmin ; Takemoto, Tadashi
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
1014
Lastpage :
1020
Abstract :
The Cu6Sn5 intermetallic compound is generated at the interface between OSP substrate and Sn-3.5Ag based solder containing small amount of Co or Ni additives. A small fraction of Co or Ni additive is probed in Cu6Sn5-based crystal structure, which occupies the crystal space sites of Cu atoms. The first-principle approach within the density functional theory is employed herein to explore the favorite sites of Ni and Co atoms in Cu6Sn5-based intermetallic compound. In the additive concentration regime of 0.0mnplus18.2 at.%, the Ni atoms occupancy leads to a more thermodynamically stable (Cu, Ni)6Sn5 phase, while the Co atom occupancy results in a less stable phase, regardless of the occupancy sites. The density of states (DOS) analysis indicates that the Co occupancy in (Cu, Co)6Sn5 also leads to a less stable electronic structure. Basically, the Ni occupancy in (Cu, Ni)6Sn5 phase enhances the electronic structure stabilization. At the low Ni concentration level (9.1 at.% in Cu5Ni1Sn5 phase), the Ni atoms prefers to occupy 4a Cu atom site; while the Ni atoms will be located at 8f2 Cu atom site at the high concentration level (18.2 at.% in Cu4Ni2Sn5 phase).
Keywords :
ab initio calculations; alloying additions; band structure; copper alloys; crystal microstructure; crystal structure; density functional theory; electronic density of states; nickel alloys; silver alloys; solders; thermodynamics; tin alloys; total energy; (CuCo)6Sn5; (CuNi)6Sn5; OSP substrate; crystal structure; density functional theory; density-of-states analysis; electronic structure; first-principle approach; intermetallic compound; organic solderability preservatives; solder; thermodynamically-stable phase; Additives; Crystal microstructure; Density functional theory; Electrons; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Soldering; Thermodynamics; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074136
Filename :
5074136
Link To Document :
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