Title :
The probabilistic analysis of immunity of a data transmission channel to the influence of periodically repeating voltage pulses
Author :
Parfenov, Yuri V. ; Kohlberg, Ira ; Radasky, William A. ; Titov, Boris A. ; Zdoukhov, Leonid N.
Author_Institution :
Assoc. Inst. for High Temps., Russian Acad. of Sci., Moscow
Abstract :
A calculation model to estimate data channel degradation due to the influence of periodically repeating voltage pulses is presented in this paper. These periodically repeating voltages can be caused by accidental or intentional disturbances that are either injected onto a communications line or coupled to the line by a radiated field. Comparative analysis of the influence of different pulse disturbances of equal average power is performed. The developed calculation model is justified by means of experiments.
Keywords :
channel estimation; computer networks; data communication; probability; average power disturbances; data channel degradation; data transmission channel; intentional disturbances; probabilistic analysis; Data communication; Electromagnetic compatibility; Voltage;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559867
