• DocumentCode
    2070512
  • Title

    Pulse testing of network interface cards for upset and damage

  • Author

    Savage, Edward ; Radasky, William ; Smith, Kenneth ; Madrid, Michael

  • Author_Institution
    Metatech Corp., Goleta, CA
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    287
  • Lastpage
    290
  • Abstract
    This paper reports on pulsed tests used to determine the susceptibility levels of various common NIC (network interface cards). It gives upset and damage levels for those cards and discusses various aspects of performing such tests.
  • Keywords
    computer equipment testing; electromagnetic interference; electromagnetic pulse; network interfaces; NIC; damage levels; network interface cards; pulse testing; Electromagnetic compatibility; Network interfaces; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559868
  • Filename
    4559868
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2070512