Title :
Photorefractive characterization system controlling diode laser wavelength
Author :
Lara, Carlos Manuel García ; Sánchez, Rubén Vázquez ; Anzueto, Jorge Camas
Author_Institution :
Coordinacion de Ingenieria Ambiental, UNICACH, Mexico City
Abstract :
We present an automatic system to characterize photorefractive samples using a wavelength tuned diode laser. We have transmittance and absorption results using GaAs/AlGaAs photorefractive quantum wells samples. Moreover we present excitonic peak results due at light and heavy holes. The system was created using a step motor to control the wavelength required, using a photodiode connected to a lock-in amplifier and with interface to computer via RS-232 port we obtain the signal.
Keywords :
III-V semiconductors; absorption coefficients; aluminium compounds; control engineering computing; gallium arsenide; materials testing; measurement by laser beam; optical control; peripheral interfaces; photodiodes; photorefractive effect; photorefractive materials; physics computing; semiconductor lasers; semiconductor quantum wells; GaAs-AlGaAs; RS-232 port; absorption coefficients; automatic system; diode laser; excitonic peak; lock-in amplifier; photodiode; photorefractive quantum wells; step motor; transmittance; Absorption; Amplifiers; Automatic control; Control systems; Diode lasers; Gallium arsenide; Optical control; Photodiodes; Photorefractive effect; Photorefractive materials;
Conference_Titel :
Electronics and Photonics, 2006. MEP 2006. Multiconference on
Conference_Location :
Guanajuato
Print_ISBN :
1-4244-0627-7
Electronic_ISBN :
1-4244-0628-5
DOI :
10.1109/MEP.2006.335627
