• DocumentCode
    2070805
  • Title

    Using guiding heuristics to improve the dynamic checking of temporal properties in data dominated high-level designs

  • Author

    Dias Junior, Alair ; da Silva Junior, Diogenes C.

  • Author_Institution
    FUMEC Univ., Belo Horizonte, Brazil
  • fYear
    2013
  • fDate
    5-7 Aug. 2013
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    Functional verification of data dominated high-level designs is a major concern in modern integrated circuit production flow. On the one hand, the size and complexity of the input state-space prevent conventional validation strategies to check the behaviour of the design thoroughly using simulation. On the other hand, formal verification methods still face difficulties while verifying high-level designs, specially when complex data types and dynamically allocated data structures are used. This work presents a method based on guiding heuristics for dynamically checking temporal properties of high-level designs. The properties are translated into heuristic functions that are combined with the black-box model of the system in order to guide the validation effort to error prone regions of the design´s input domain. The functions are designed in a way that their minimum points correspond to properties violations, if they exist. Optimization algorithms are used to evaluate the property under check by searching for input sequences that minimize the heuristic functions. Experiments indicate a significant improvement in the efficiency of the verification process when the proposed method is used, with respect to both random simulation and bounded model checking.
  • Keywords
    data structures; electronic engineering computing; formal verification; integrated circuit design; optimisation; black-box model; bounded model checking; data dominated high-level designs; data structure allocation; dynamic checking; formal verification methods; functional verification; guiding heuristics; heuristic functions; integrated circuit production flow; optimization algorithms; random simulation; temporal properties; Heuristic algorithms; Integrated circuit modeling; Mathematical model; Model checking; Optimization; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2013 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Natal
  • ISSN
    2159-3469
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2013.6654617
  • Filename
    6654617