Title :
Using guiding heuristics to improve the dynamic checking of temporal properties in data dominated high-level designs
Author :
Dias Junior, Alair ; da Silva Junior, Diogenes C.
Author_Institution :
FUMEC Univ., Belo Horizonte, Brazil
Abstract :
Functional verification of data dominated high-level designs is a major concern in modern integrated circuit production flow. On the one hand, the size and complexity of the input state-space prevent conventional validation strategies to check the behaviour of the design thoroughly using simulation. On the other hand, formal verification methods still face difficulties while verifying high-level designs, specially when complex data types and dynamically allocated data structures are used. This work presents a method based on guiding heuristics for dynamically checking temporal properties of high-level designs. The properties are translated into heuristic functions that are combined with the black-box model of the system in order to guide the validation effort to error prone regions of the design´s input domain. The functions are designed in a way that their minimum points correspond to properties violations, if they exist. Optimization algorithms are used to evaluate the property under check by searching for input sequences that minimize the heuristic functions. Experiments indicate a significant improvement in the efficiency of the verification process when the proposed method is used, with respect to both random simulation and bounded model checking.
Keywords :
data structures; electronic engineering computing; formal verification; integrated circuit design; optimisation; black-box model; bounded model checking; data dominated high-level designs; data structure allocation; dynamic checking; formal verification methods; functional verification; guiding heuristics; heuristic functions; integrated circuit production flow; optimization algorithms; random simulation; temporal properties; Heuristic algorithms; Integrated circuit modeling; Mathematical model; Model checking; Optimization; Vectors;
Conference_Titel :
VLSI (ISVLSI), 2013 IEEE Computer Society Annual Symposium on
Conference_Location :
Natal
DOI :
10.1109/ISVLSI.2013.6654617