DocumentCode :
2070970
Title :
Non-destructive evaluation of seams of laser welded tools using the CS-eddy current technique
Author :
Crostack, Horst-Artur ; Maass, M.
Author_Institution :
Dortmund Univ., Germany
Volume :
4
fYear :
1998
fDate :
31 Aug-4 Sep 1998
Firstpage :
2279
Abstract :
Present testing methods for evaluating the integrity of a welding seam of laser welded tools, like bend or shock testing, may possibly introduce damage into the tool. Statistically performed destructive tests are expensive and not reliable as 100% NDT (nondestructive testing). Furthermore, usual destructive tests for laser welded tools, like shearing or tearing tests, do not describe the complexity of the loads in service and therefore cannot deliver clear indications about the reliability of the seam. This article describes the possibilities of the nondestructive controlled signals (CS) pulsed eddy current technique for evaluating the characteristics of laser welded seams. The presented results were achieved from measurements on laser welded seams of saw blades. The used handling-system was built up similar to the requirements of a testing system suitable for online process control and the achieved results therefore describe well the possibilities in practice. The online description of different seam characteristics (pores and cracks in the seam, differing geometry of the seam, etc.) enables an optimisation of the welding process and consequently leads to the economic production of high quality products and to higher security in operation
Keywords :
eddy current testing; inspection; laser beam welding; quality control; NDT; crack detection; laser welded tool seams inspection; nondestructive controlled signals pulsed eddy current technique; nondestructive testing; pore detection; saw blades; seam characteristics; Blades; Eddy currents; Electric shock; Nondestructive testing; Optical control; Optical pulses; Performance evaluation; Shearing; System testing; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
Conference_Location :
Aachen
Print_ISBN :
0-7803-4503-7
Type :
conf
DOI :
10.1109/IECON.1998.724076
Filename :
724076
Link To Document :
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