Title :
3D packaging with through ilicon via (TSV) for electrical and fluidic interconnections
Author :
Khan, Navas ; Yu, Li Hong ; Pin, Tan Siow ; Ho, Soon Wee ; Su, Nandar ; Hnin, Wai Yin ; Kripesh, Vaidyanathan ; Pinjala ; Lau, John H. ; Chuan, Toh Kok
Author_Institution :
Inst. of Microelectron., Agency for Sci., Technol. & Res., Singapore
Abstract :
In this paper a liquid cooling solution has been reported for 3-D package in PoP format. The high heat dissipating chip is mounted on a silicon carrier, which has copper through-silicon via for electrical interconnection and through-silicon hollow via for fluidic circulation. Heat enhancement structures have been embedded in the chip carrier. Cooling liquid, de-ionized water is circulated through the chip carrier and heat from the chip is extracted. The fluidic channels are isolated from electrical traces using hermetic sealing. The research work has demonstrated 100 W of heat dissipation from one stack and total of 200 W from two stacks of the package. The fluidic interconnections and sealing techniques have been discussed.
Keywords :
cooling; integrated circuit interconnections; microfluidics; packaging; seals (stoppers); 3D packaging; PoP format; electrical interconnections; fluidic channels; fluidic circulation; fluidic interconnections; heat dissipation; heat enhancement structures; hermetic sealing; liquid cooling; through silicon hollow vias; Heat transfer; Integrated circuit interconnections; Liquid cooling; Semiconductor device packaging; Silicon; Space heating; Stacking; Thermal conductivity; Through-silicon vias; Wafer scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074157