DocumentCode :
2071085
Title :
Numerical evaluation of the influence of technology incorrectness on CoolMOS features
Author :
Lisik, Zbigniew ; Podgorski, Jacek ; Raj, Ewa
Author_Institution :
Inst. of Electron., Lodz Tech. Univ., Poland
fYear :
2004
fDate :
28-28 Feb. 2004
Firstpage :
565
Lastpage :
567
Abstract :
The modern unipolar power structures - CoolMOS were to become a breakthrough among the power devices. However, until now no one could manufacture the structures, which parameters overcome the parameters of traditional VDMOS transistors in a significant way. The cause of it is placed in the fact, probably that the manufacturing technology for them is very complicated and advanced. The authors have introduced the analyses of dependencies of the CoolMOS transistor static parameters versus its constructional ones.
Keywords :
numerical analysis; power MOSFET; CoolMOS transistor static parameters; VDMOS transistors; manufacturing technology; numerical evaluation; power devices; technology incorrectness; unipolar power structures; Doping; Fabrication; MOSFET circuits; Manufacturing; Power MOSFET; Power semiconductor devices; Power transistors; Semiconductor device manufacture; Technological innovation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2004. Proceedings of the International Conference
Conference_Location :
Lviv-Slavsko, Ukraine
Print_ISBN :
966-553-380-0
Type :
conf
Filename :
1366073
Link To Document :
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