Title :
Models of reliability characteristics for symmetric ramified systems
Author_Institution :
Lviv Polytech. Nat. Univ., Ukraine
Abstract :
Main reliability characteristics for unrestorable symmetric systems ramified to level 3 and with ageing output elements are examined in this paper. Models for the failure probability, the failure frequency and the failure rate are worked out in the case when the lifetime of ageing output elements is circumscribed by the Rayleigh distribution.
Keywords :
Weibull distribution; failure analysis; probability; reliability theory; Rayleigh distribution; ageing output elements; failure frequency; failure probability; failure rate; lifetime; reliability characteristics; symmetric ramified systems; unrestorable symmetric systems; Aging; Availability; Computer network reliability; Computer networks; Control charts; Exponential distribution; Frequency; Hazards; Reliability theory; Weibull distribution;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2004. Proceedings of the International Conference
Conference_Location :
Lviv-Slavsko, Ukraine
Print_ISBN :
966-553-380-0
