• DocumentCode
    2071240
  • Title

    Evaluation of a module based memory system with an LCP flex interconnect

  • Author

    Kollipara, Ravi ; Li, Ming ; Mullen, Don ; Beyene, Wendemagegnehu ; Madden, Chris ; Yuan, Chuck ; Kusamitsu, Hideki ; Ito, Toshiyasu

  • Author_Institution
    Rambus, Inc., Los Altos, CA
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    1200
  • Lastpage
    1206
  • Abstract
    An LCP flex interconnect is used to bypass the core vias and balls of the memory controller package, the PTH vias and traces of the FR-4 motherboard and memory module, and the traditional through-hole or SMT DIMM connector. A mating two-piece pin-grid array connector that can accommodate 36 differential pair signals is used to interface the flex to the memory controller package. On the memory side, the DRAM CSP package is directly soldered to the top layer of the flex and the bottom layer of the flex is soldered to the memory module via solder balls. Controller and memory test chips that are capable of operating in the 10 to 16 Gbps range are used for evaluating the possible data rates for 6" and 12" long flex links. The system margins are compared to a 3" long motherboard-soldered memory system that was shown to operate at 16 Gbps.
  • Keywords
    DRAM chips; electric connectors; integrated circuit interconnections; integrated circuit packaging; modules; DRAM CSP package; FR-4 motherboard; LCP flex interconnect; SMT DIMM connector; bit rate 10 Gbit/s to 16 Gbit/s; mating connector; memory controller package; memory module; memory test chips; solder balls; system margins; through-hole connector; two-piece pin-grid array connector; Bandwidth; Connectors; Control systems; Flexible printed circuits; Impedance; Integrated circuit interconnections; Packaging; Random access memory; Routing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074164
  • Filename
    5074164