• DocumentCode
    2071307
  • Title

    Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation

  • Author

    Ding, W. ; Gorbach, A.V. ; Wadsworth, W.J. ; Knight, J.C. ; Skryabin, D.V. ; Strain, M.J. ; Sorel, M. ; De La Rue, R.M.

  • Author_Institution
    Dept. of Phys., Univ. of Bath, Bath, UK
  • fYear
    2011
  • fDate
    22-26 May 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Silicon photonics has attracted much attention. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation.
  • Keywords
    integrated optics; optical correlation; optical solitons; optical variables measurement; optical waveguides; silicon-on-insulator; SOI waveguides; Si; frequency-domain measurements; nonlinear processes; silicon photonics; soliton formation; subwavelength silicon waveguides; subwavelength silicon-on-insulator waveguides; time-domain measurements; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
  • Conference_Location
    Munich
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0533-5
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/CLEOE.2011.5943163
  • Filename
    5943163