• DocumentCode
    2071333
  • Title

    EMI simulation based on cavity-mode model for power-bus radiation calculation of power/ground planes with IC/LSI

  • Author

    Toyota, Yoshitaka ; Nishida, Masahiro ; Iokibe, Kengo ; Koga, Ryuji ; Wada, Osami

  • Author_Institution
    Dept. of Commun. Network Eng., Okayama Univ., Okayama
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    423
  • Lastpage
    426
  • Abstract
    This paper describes an electromagnetic interference (EMI) simulation of radiated emissions caused by simultaneous switching noise in an irregular power/ground plane structure. For quick simulation of the radiated emissions from the power-bus edges, we used a series of analytical approaches: power-bus resonance characterization by a fast algorithm based on a cavity-mode model and a segmentation method and radiation calculation using equivalent magnetic current based on the field equivalent principle. The analytically based radiation calculation is achieved within a few minutes on a single personal computer and agrees with the actual measurements. Furthermore, this paper demonstrates an EMI simulation with and without decoupling capacitors by using a linear macro model of an integrated circuit as a noise source. We found a fair agreement between the simulation and measured results.
  • Keywords
    electromagnetic interference; integrated circuits; large scale integration; EMI simulation; IC/LSI; cavity-mode model; electromagnetic interference; power-bus radiation calculation; power/ground planes; segmentation method; switching noise; Circuit simulation; Computational modeling; Electromagnetic interference; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit noise; Large scale integration; Magnetic analysis; Magnetic noise; Magnetic resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559902
  • Filename
    4559902