Title :
Field use environment for a FCBGA in a laptop computer application
Author :
Darveaux, Robert ; Reichman, Corey ; Berry, Christopher J.
Author_Institution :
Amkor Technol., Inc., Chandler, AZ
Abstract :
A laptop computer was disassembled, and several thermocouples were attached to the die, heat sink, substrate, and motherboard. The laptop was then re-assembled and run under various conditions to measure the effects on temperature distribution. The assembly was then deconstructed and samples were extracted for material property measurements. Elastic modulus and thermal expansivity were measured for the heat sink, substrate, motherboard, thermal interface pad, and underfill materials. Typical temperature rise of the IGP die above ambient was 40 C. Video use increased the temperature by 5 C to 10 C. Wrapping the laptop to constrict airflow increased the temperature by 15 C. Hence, the operating temperature range is approximately 55 C to 80 C. The substrate and motherboard are hotter on the side facing the CPU. There are gradients of up to 20 C in the structure (difference between hottest and coolest regions). The initial temperature change rate during a power cycle is 5 C/sec for the IGP die.
Keywords :
ball grid arrays; elastic moduli measurement; flip-chip devices; heat sinks; laptop computers; temperature distribution; thermal expansion measurement; thermal management (packaging); thermocouples; FCBGA package; IGP die; elastic modulus; flip chip ball grid array; heat sink; laptop computer application; material property measurement; temperature 40 C; temperature 5 C to 10 C; temperature 55 C to 80 C; temperature distribution; thermal expansivity; thermal interface pad; thermocouple; underfill materials; Application software; Assembly; Central Processing Unit; Computer applications; Fasteners; Heat sinks; Portable computers; Power dissipation; Temperature distribution; Thermal expansion;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074169