Title :
Nuclear radiation detectors on various type diamonds
Author :
Blum, F. ; Denisenko, A. ; Job, R. ; Borchert, D. ; Weber, W. ; Borany, J.v. ; Hilleringmann, U. ; Fahrner, W.R.
Author_Institution :
Dept. of Electr. Eng., Hagen Univ., Germany
fDate :
31 Aug-4 Sep 1998
Abstract :
The sensitivity of radiation sensors based on various quality CVD diamond films was studied. The sensors were exposed to a low dose γ irradiation (60Co source). The diamond substrates were characterised by optical absorption, photo (PL)- and cathodoluminescence (CL) techniques. The comparison of the radiation response signal to the results of the optical studies revealed that the Si related defects inside the single crystallites of the films strongly reduce the sensitivity of the sensors and cause large ionisation currents. It was shown that the free exciton recombination intensity in CL can serve as a direct measure of the radiation sensitivity of diamond. Also it was demonstrated that optical absorption can only be used for initial selection of the diamond substrates
Keywords :
CVD coatings; cathodoluminescence; diamond; light absorption; particle detectors; photoluminescence; radiation detection; C; CVD diamond films; cathodoluminescence; detection sensitivity; diamond substrates; free exciton recombination intensity; ionisation currents; low dose γ irradiation; optical absorption; photoluminescence; radiation response signal; radiation sensors; Crystallization; Electromagnetic wave absorption; Gamma ray detectors; Gas detectors; Ionizing radiation; Optical films; Optical sensors; Radiation detectors; Semiconductor films; Sensor phenomena and characterization;
Conference_Titel :
Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
Conference_Location :
Aachen
Print_ISBN :
0-7803-4503-7
DOI :
10.1109/IECON.1998.724097