• DocumentCode
    2071396
  • Title

    Nuclear radiation detectors on various type diamonds

  • Author

    Blum, F. ; Denisenko, A. ; Job, R. ; Borchert, D. ; Weber, W. ; Borany, J.v. ; Hilleringmann, U. ; Fahrner, W.R.

  • Author_Institution
    Dept. of Electr. Eng., Hagen Univ., Germany
  • Volume
    4
  • fYear
    1998
  • fDate
    31 Aug-4 Sep 1998
  • Firstpage
    2382
  • Abstract
    The sensitivity of radiation sensors based on various quality CVD diamond films was studied. The sensors were exposed to a low dose γ irradiation (60Co source). The diamond substrates were characterised by optical absorption, photo (PL)- and cathodoluminescence (CL) techniques. The comparison of the radiation response signal to the results of the optical studies revealed that the Si related defects inside the single crystallites of the films strongly reduce the sensitivity of the sensors and cause large ionisation currents. It was shown that the free exciton recombination intensity in CL can serve as a direct measure of the radiation sensitivity of diamond. Also it was demonstrated that optical absorption can only be used for initial selection of the diamond substrates
  • Keywords
    CVD coatings; cathodoluminescence; diamond; light absorption; particle detectors; photoluminescence; radiation detection; C; CVD diamond films; cathodoluminescence; detection sensitivity; diamond substrates; free exciton recombination intensity; ionisation currents; low dose γ irradiation; optical absorption; photoluminescence; radiation response signal; radiation sensors; Crystallization; Electromagnetic wave absorption; Gamma ray detectors; Gas detectors; Ionizing radiation; Optical films; Optical sensors; Radiation detectors; Semiconductor films; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
  • Conference_Location
    Aachen
  • Print_ISBN
    0-7803-4503-7
  • Type

    conf

  • DOI
    10.1109/IECON.1998.724097
  • Filename
    724097