• DocumentCode
    2071418
  • Title

    Effect of power supply imbalance on NF of CMOS low noise amplifier for UHF RFID applications

  • Author

    Koo, Kyoungchoul ; Shim, Jongjoo ; Park, Hyunjeong ; Kim, Joungho

  • Author_Institution
    Sch. of EECS, KAIST, Daejeon
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    431
  • Lastpage
    434
  • Abstract
    In this paper, noise figure (NF) degradation of CMOS low noise amplifier (LNA) for UHF RFID application, which is caused by power/ground noise (P/G noise) from power supply imbalance is analyzed. Then, a modified NF formula to estimate the effect of P/G noise from power supply imbalance is proposed. Because the power supply imbalance is caused by package (PKG) and on-chip power/ground distribution network (PDN) structure, PKG and on-chip PDN are modeled. Also, the equivalent circuit of LNA is modeled to simulate the proposed NF formula. The proposed NF formula is verified with measurement of single-tone and clock P/G noise. It shows 50 m, 800 MHz single-tone P/G noise at PKG PWR/GND port degrades about 120 dB of NF at 800 MHz.
  • Keywords
    CMOS analogue integrated circuits; equivalent circuits; low noise amplifiers; radiofrequency identification; CMOS low noise amplifier; UHF RFID; noise figure; power supply imbalance; power/ground distribution network structure; power/ground noise; Circuit noise; Degradation; Equivalent circuits; Low-noise amplifiers; Network-on-a-chip; Noise figure; Noise measurement; Packaging; Power supplies; Radiofrequency identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559904
  • Filename
    4559904