Title :
Conducted interference immunity test to high-speed power line communication system
Author :
Hosoya, Satoshi ; Tokuda, Masamitsu ; Matsuo, Takashi
Author_Institution :
Musashi Inst. of Technol., Tokyo
Abstract :
In this paper, we measured the immunity characteristics to the conducted interference wave, from the aspect of PHY rate (physical layer date rate) of PLC (power line communication) system, and compared with simulation results by MATLAB/Simulink. When the interference signal is impressed to the OFDM (orthogonal frequency division multiplexing) signal, the PHY rate decrease rapidly below C/I (carrier / interference) = -10 dB and become nearly zero around C/I = -70 dB, and so it turns out that the PLC system with OFDM signal has an good narrowband interference immunity characteristic. Furthermore, it is revealed that the PHY rate (physical layer date rate) of PLC modem can be calculated by MATLAB/Simulink even when the narrowband interference signal is impressed through the power line. In addition, we examined the improving effect of the notch band for the immunity characteristics to the conducted interference wave. As a result, it is revealed that the PHY rate normalized by the maximum value increases by about 20% by inserting the notch when impressing the interference signal in the notch band and C/I is improved by 10~15 dB by inserting the notch.
Keywords :
OFDM modulation; carrier transmission on power lines; immunity testing; interference suppression; OFDM; high-speed power line communication system; interference immunity test; narrowband interference immunity characteristic; notch band; orthogonal frequency division multiplexing; Interference; MATLAB; Modems; Narrowband; OFDM; Physical layer; Power line communications; Power measurement; Programmable control; System testing;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559907