DocumentCode
2071491
Title
Effect of damping and air cushion on dynamic responses of PCB under product level free drop impact
Author
Park, Seungbae ; Yu, Da ; Al-Yafawi, Abdullah ; Kwak, Jae ; Lee, John
Author_Institution
Dept. of Mech. Eng., State Univ. of New York at Binghamton, Binghamton, NY
fYear
2009
fDate
26-29 May 2009
Firstpage
1256
Lastpage
1262
Abstract
The dynamic response of printed circuit board (PCB) is a major concern to electronic manufacturers when it is subjected to drop impact. In this work, more realistic drop condition is achieved through product-level free drop test. A repeatable free-drop system is developed with an adjustable pair of forks to control the impact orientation during the guided free drop. Digital image correlation (DIC) technique is applied to measure and produce the full-field dynamic responses of PCB. Air cushion effect between mobile phone and impact surface is found experimentally, which may be considered significant for the product-level free drop test. The rebound test has been performed to measure the actual impact velocity and to provide a better insight into the drop impact event. The effect of impact velocity is investigated to assess dynamic responses of PCB. Along with the drop impact experiments, the 3D FEA models are analyzed using ANSYS/LS-DYNA. The energy loss from the damping is considered by including the Rayleigh damping in this FEA model. Vibration analysis is performed experimentally and numerically to choose the proper damping parameters.
Keywords
damping; finite element analysis; mobile handsets; printed circuits; software packages; 3D FEA models; ANSYS/LS-DYNA; Rayleigh damping; air cushion; digital image correlation; dynamic responses; mobile phone; printed circuit board; product level free drop impact; vibration analysis; Circuit testing; Control systems; Damping; Digital images; Energy loss; Manufacturing; Mobile handsets; Performance evaluation; Printed circuits; Velocity measurement; PCB; Rayleigh damping; air cushion effect; finite element method; product level free drop impact;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4244-4475-5
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2009.5074172
Filename
5074172
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