Title :
Modeling of IR-Drop induced delay fault in CNT and GNR power distribution networks
Author :
Das, Divya ; Rahaman, Hafizur
Author_Institution :
Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur, India
Abstract :
The work in this paper analyses the delay fault in logic circuits due to power supply voltage drop (IR-Drop) in carbon nanotube (CNT) and graphene nanoribbon (GNR) interconnects for 16 nm technology node. The electrical equivalent model is used to derive the electrical circuit parameters for CNT and GNR interconnects. The results are compared with that of traditional copper (Cu) based interconnects. It has been found that the delay faults can be reduced using CNT and GNR power interconnects at longer lengths as compared to the traditional Cu based power interconnects.
Keywords :
carbon nanotubes; delays; equivalent circuits; fault diagnosis; graphene; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated logic circuits; nanoribbons; C; CNT power distribution network; GNR power distribution network; IR-drop induced delay fault; electrical equivalent model; graphene nanoribbon interconnect; logic circuits; power supply voltage drop; size 16 nm; Carbon nanotube (CNT); delay; graphene nanoribbon (GNR); interconnect; power supply voltage drop (IR drop);
Conference_Titel :
Computers and Devices for Communication (CODEC), 2012 5th International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4673-2619-3
DOI :
10.1109/CODEC.2012.6509350
