Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]

The importance of the electromagnetic compatibility (EMC) of electronic devices has permanently gained more and more significance during the last years. Therefore, all the manufacturers of electronic devices and systems as well as the manufacturers of integrated circuits are forced to develop their products according to EMC-requirements. The characterisation of integrated circuits could be done with the measurement methods described in the two standards IEC 61967 (electromagnetic emission) and IEC 62132 (electromagnetic immunity). Because these two standards are relatively new, and still under development, this paper demonstrates some measurement experience in the use of the electromagnetic emission measurement methods according to the IEC 61967.