• DocumentCode
    2071801
  • Title

    Influence of external electric fields on electronic response and bandstructure of carbon nanotubes

  • Author

    Li, Yan ; Rotkin, Slava V. ; Ravaioli, Umberto

  • Author_Institution
    Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    12-14 Aug. 2003
  • Firstpage
    1
  • Abstract
    We performed tight-binding calculation of the electronic properties of carbon nanotubes in a perpendicular electric field. Within the linear response limit, the dielectric function of a doped carbon nanotube is found to depend not only on its symmetry, but also on the Fermi level position and tube radius. Upon increasing the field, the mixing of neighboring sub bands results in metal-semiconductor transitions in both quasi-metallic and semiconducting nanotubes. The characteristic field strength of the transitions is calculated as a function of the tube radius. An optimal radius range to be used for band gap engineering is estimated for both types.
  • Keywords
    Fermi level; SCF calculations; carbon nanotubes; dielectric function; dielectric materials; electric field effects; electrical conductivity transitions; electronic density of states; energy gap; permittivity; semiconductor materials; tight-binding calculations; C; Fermi level; band gap; bandstructure; carbon nanotubes radius; characteristic field strength; dielectric function; electronic properties; external electric fields; metal-semiconductor transitions; neighboring sub bands mixing; perpendicular electric field; quasimetallic nanotubes; semiconducting nanotubes; tight-binding calculation; Carbon nanotubes; Dielectric constant; Electrons; Nanoscale devices; Nonuniform electric fields; Photonic band gap; Semiconductivity; Semiconductor nanotubes; Temperature dependence; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
  • Print_ISBN
    0-7803-7976-4
  • Type

    conf

  • DOI
    10.1109/NANO.2003.1231699
  • Filename
    1231699