DocumentCode :
2071899
Title :
Characterization of ferromagnetic Co-implanted rutile TiO2(110)
Author :
Shutthanandan, V. ; Thevuthasan, S. ; Engelhard, M.H. ; Droubay, T. ; Heald, S.M. ; Saraf, L.V. ; Chambers, S.A. ; Taylor, B. ; Sears, R.P. ; Sinkovic, B. ; Mun, B.S.
Author_Institution :
Environ. Molecular Sci. Lab., Pacific Northwest Nat. Lab., Richland, WA, USA
Volume :
1
fYear :
2003
fDate :
12-14 Aug. 2003
Firstpage :
13
Abstract :
Co ions of energy 100 KeV and fluences between 1.25×1016 and 5.0×1016 Co+/cm2 were implanted in single crystal TiO2(110) substrates at temperatures of 300, 875 and 1075 K. Co depth profiles were obtained using X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry. The Co diffused to a much greater depth when implanted at 1075 K compared to implantation at lower temperatures. The valence state of Co was investigated using Co K and L edge X-ray absorption near edge spectra. Although implantation at lower temperatures results in a mixture of metallic and oxidized Co, implantation at 1075 K results in no measurable Co(0) in the sample. The magnetic properties were investigated using magneto-optical Kerr-effect and vibrating sample magnetometer. The sample implanted at 1075 K shows ferromagnetic properties at room temperature.
Keywords :
Kerr magneto-optical effect; Rutherford backscattering; X-ray photoelectron spectra; XANES; cobalt; coercive force; doping profiles; ferromagnetic materials; magnetic semiconductors; titanium compounds; valency; 1075 K; 293 to 298 K; 300 K; 875 K; Co depth profiles; Rutherford backscattering spectrometry; TiO2:Co; X-ray absorption near edge spectra; X-ray photoelectron spectra; diffusion; ferromagnetic Co implanted rutile TiO2; ferromagnetic properties; ion implantation; magnetic properties; magneto optical Kerr effect; metallic Co-oxidised Co mixtures; room temperature; single crystal TiO2 substrates; valence state; vibrating sample magnetometer; Backscatter; Electromagnetic wave absorption; Light sources; Magnetic materials; Magnetic properties; Magnetic semiconductors; Semiconductor materials; Spectroscopy; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN :
0-7803-7976-4
Type :
conf
DOI :
10.1109/NANO.2003.1231702
Filename :
1231702
Link To Document :
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