DocumentCode
2071977
Title
What you need is what you get!: The vision of view-based requirements specifications
Author
Gross, Anne ; Doerr, Joerg
Author_Institution
Fraunhofer IESE, Kaiserslautern, Germany
fYear
2012
fDate
24-28 Sept. 2012
Firstpage
171
Lastpage
180
Abstract
Software requirements specifications play a crucial role in software development projects. Especially in large projects, these specifications serve as a source of communication and information for a variety of roles involved in downstream activities like architecture, design, and testing. This vision paper argues that in order to create high-quality requirements specifications that fit the specific demands of successive document stakeholders, our research community needs to better understand the particular information needs of downstream development roles. In this paper, the authors introduce the idea of view-based requirements specifications. Two scenarios illustrate (1) current problems and challenges related to the research underlying the envisioned idea and (2) how these problems could be solved in the future. Based on these scenarios, challenges and research questions are outlined and supplemented with current results of exemplary user studies. Furthermore, potential future research is suggested, which the community should perform to answer the research questions as part of a research agenda.
Keywords
document handling; formal specification; information needs; project management; document stakeholders; downstream development roles; high-quality requirements specifications; information needs; software development projects; software requirements specifications; view-based requirements specifications; Business; Communities; Computer architecture; Context; Materials; Software; Unified modeling language; empirical studies; perspective-based requirements specification; requirements specification; research agenda; view-based requirements specification;
fLanguage
English
Publisher
ieee
Conference_Titel
Requirements Engineering Conference (RE), 2012 20th IEEE International
Conference_Location
Chicago, IL
ISSN
1090-750X
Print_ISBN
978-1-4673-2783-1
Electronic_ISBN
1090-750X
Type
conf
DOI
10.1109/RE.2012.6345801
Filename
6345801
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