Title :
Guiding light in different plasmoic nano-slot waveguides for nano-interconnect application
Author :
Chu, Hong-Son ; Ahmed, Iftikhar ; EWE, Wei-Bin ; Li, Er-Ping
Author_Institution :
Adv. Electron. & Electromagn. Div., A *STAR Inst. of High Performance Comput., Singapore
Abstract :
The characteristics of plasmonic nano-slot waveguides, in terms of different metallic materials and geometries, are presented in this paper. We numerically investigate how efficiently light can be guided in straight and bend types of metallic waveguide at nanoscale. For numerical simulation the Drude model incorporated finite difference time domain (FDTD) method is used to handle the dispersive nature of the metals such as gold, silver, copper, aluminum at visible and near infra-red (IR) wavelengths. It is demonstrated that the plasmonic waveguide with nano-slot is an efficient candidate for optical interconnects at the visible and near-IR range of electromagnetic spectrum. The performance of straight, 90deg and Z-bend nano-slot waveguides is discussed by means of transmission and near-field characteristics.
Keywords :
aluminium; copper; finite difference time-domain analysis; gold; integrated optoelectronics; nanoelectronics; optical interconnections; optical materials; optical waveguide theory; plasmonics; silver; waveguide discontinuities; Ag; Al; Au; Cu; Drude model; FDTD method; Z-bend nanoslot waveguides; aluminum; bend type metallic waveguide; copper; dispersive nature; electromagnetic spectrum; finite difference time domain method; gold; light guidance; metallic materials; nanointerconnect application; near infra-red wavelength operation; numerical simulation; optical interconnects; plasmoic nanoslot waveguides characteristics; silver; straight type metallic waveguide; transmission characteristics; visible wavelength operation; Dispersion; Electromagnetic waveguides; Finite difference methods; Geometry; Gold; Inorganic materials; Numerical simulation; Optical waveguides; Plasmons; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559944