DocumentCode :
2072391
Title :
A novel ultra-thin package for embedded high-pin-count LSI supported by Cu plate
Author :
Mori, Kentaro ; Ohshima, Daisuke ; Sasaki, Hideki ; Fujimura, Yuki ; Kikuchi, Katsumi ; Nakashima, Yoshiki ; Funaya, Takuo ; Nishiyama, Tomohiro ; Murakami, Tomoo ; Yamamichi, Shintaro
Author_Institution :
Device Platforms Res. Labs., NEC Corp., Sagamihara
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
1447
Lastpage :
1452
Abstract :
We have developed a thin, low-thermal-resistance LSI package by embedding a high-pin-count LSI chip into ultra-thin build-up layers supported by Cu plate. The embedded LSI chip is a microprocessor with approximately 1500 pads and a thickness of 50 mum, and it is completely laminated by the first build-up epoxy resin. The total package thickness is only 0.71 mm including a 0.5-mm-thick Cu plate for cooling, which is much thinner than the conventional flip chip ball grid array (FCBGA) package with a heat sink. Our package shows excellent warpage characteristics, smaller than 82 mum in the temperature range from -55 to +260degC. Low thermal resistance of 10.8degC/W is achieved at a wind velocity of 0 m/s, which is also comparable to that of the FCBGA with a large heat sink. We have successfully demonstrated the functions of this package using an LSI tester and personal-computer-like system board. It has also passed a 600-cycle package-level thermal cycle test.
Keywords :
cooling; copper; integrated circuit packaging; integrated circuit testing; large scale integration; microprocessor chips; thermal analysis; Cu; cooling; embedded high-pin-count LSI; epoxy resin; heat sink; microprocessor; package-level thermal cycle test; personal-computer-like system board; thermal resistance; ultra-thin package; warpage characteristics; Cooling; Electronics packaging; Epoxy resins; Flip chip; Heat sinks; Large scale integration; Microprocessors; Temperature distribution; Thermal resistance; Wind speed;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074202
Filename :
5074202
Link To Document :
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