• DocumentCode
    2072441
  • Title

    Study on measurement uncertainty in immunity testing: IEC61000-4-6

  • Author

    Kurosawa, Taiju ; Sakusabe, Takashi ; Takahashi, Takehiro ; Schibuya, Noboru

  • Author_Institution
    Grad. Sch. of Electron. & Inf. Eng., Takushoku Univ., Tokyo
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    598
  • Lastpage
    601
  • Abstract
    Factors of the measurement uncertainty (MU) are analyzed and calculated, to examine a dominant MU factor in the IEC/EMC immunity standard such as IEC61000-4-3,-6 etc., in accordance with ISO guide 17025 describing uncertainty in measurement. It was assumed that the contribution factors to MU are the measurement system repeatability, accuracy of the signal generator, amplifier gain and harmonics, accuracy of the oscilloscope, mismatch, modulation, and test-setup. From the experimental result, it was obtained that the most important uncertainty factor was ldquotest setuprdquo. This means that ldquosetuprdquo influences the test-level. Therefore, we suggest that if application of the uncertainty is effectively done, it is necessary to define the setup clearly.
  • Keywords
    IEC standards; calibration; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; immunity testing; measurement uncertainty; amplifier gain; amplifier harmonics; calibration; electromagnetic compatibility; immunity standard IEC61000-4-6; immunity testing; measurement system repeatability; measurement uncertainty; mismatch uncertainty; modulation uncertainty; oscilloscope accuracy; signal generator accuracy; test setup uncertainty; uncertainty factor; Electromagnetic compatibility; Gain measurement; IEC standards; ISO standards; Immunity testing; Measurement standards; Measurement uncertainty; Oscilloscopes; Signal generators; System testing; immunity testing; measurement uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559946
  • Filename
    4559946