DocumentCode
2072441
Title
Study on measurement uncertainty in immunity testing: IEC61000-4-6
Author
Kurosawa, Taiju ; Sakusabe, Takashi ; Takahashi, Takehiro ; Schibuya, Noboru
Author_Institution
Grad. Sch. of Electron. & Inf. Eng., Takushoku Univ., Tokyo
fYear
2008
fDate
19-23 May 2008
Firstpage
598
Lastpage
601
Abstract
Factors of the measurement uncertainty (MU) are analyzed and calculated, to examine a dominant MU factor in the IEC/EMC immunity standard such as IEC61000-4-3,-6 etc., in accordance with ISO guide 17025 describing uncertainty in measurement. It was assumed that the contribution factors to MU are the measurement system repeatability, accuracy of the signal generator, amplifier gain and harmonics, accuracy of the oscilloscope, mismatch, modulation, and test-setup. From the experimental result, it was obtained that the most important uncertainty factor was ldquotest setuprdquo. This means that ldquosetuprdquo influences the test-level. Therefore, we suggest that if application of the uncertainty is effectively done, it is necessary to define the setup clearly.
Keywords
IEC standards; calibration; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; immunity testing; measurement uncertainty; amplifier gain; amplifier harmonics; calibration; electromagnetic compatibility; immunity standard IEC61000-4-6; immunity testing; measurement system repeatability; measurement uncertainty; mismatch uncertainty; modulation uncertainty; oscilloscope accuracy; signal generator accuracy; test setup uncertainty; uncertainty factor; Electromagnetic compatibility; Gain measurement; IEC standards; ISO standards; Immunity testing; Measurement standards; Measurement uncertainty; Oscilloscopes; Signal generators; System testing; immunity testing; measurement uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-981-08-0629-3
Electronic_ISBN
978-981-08-0629-3
Type
conf
DOI
10.1109/APEMC.2008.4559946
Filename
4559946
Link To Document