DocumentCode :
2072446
Title :
Miniaturized low-loss millimeter-wave rat-race balun in a CMOS 28 nm technology
Author :
Burdin, François ; Podevin, Florence ; Franc, Anne-Laure ; Pistono, Emmanuel ; Gloria, Daniel ; Ferrari, Philippe
Author_Institution :
LAHC, IMEP, Grenoble, France
fYear :
2011
fDate :
15-16 Sept. 2011
Firstpage :
73
Lastpage :
76
Abstract :
This paper presents the design of an integrated rat-race coupler for balun applications based on high quality factor Slow-wave CoPlanar Waveguides (S-CPW) transmission lines in millimeter wave frequencies. The 28 nm CMOS advanced digital technology by STMicroelectronics is used. The design procedure is detailed. Phase-inverter and optimized criteria for the transmission lines characteristics are used to minimize insertion losses and surface on the die. A 3D full wave EM software coupled to a circuit simulator is used to optimize the various building blocs. The compact and low-loss rat-race coupler shows state-of-art very exciting and promising performances. It occupies a 0.086 mm2 area. From 52 GHz till 67 GHz, return loss is better than 15 dB, while coupling factors are identical, varying between -4.2 and -4.4 dB, that means 1.4 dB maximal insertion loss. Finally between 13 and 85.5 GHz, the phase difference is kept constant, equal to 180°±1° while the isolation is better than 44 dB.
Keywords :
CMOS digital integrated circuits; Q-factor; baluns; coplanar waveguides; field effect MIMIC; integrated circuit design; waveguide couplers; 3D full wave EM software; CMOS advanced digital technology; S-CPW transmission lines; STMicroelectronics; circuit simulator; coupling factors; criteria optimization; frequency 52 GHz to 67 GHz; high-quality factor; insertion loss minimization; integrated rat-race coupler; loss 1.4 dB; millimeter wave frequencies; miniaturized low-loss millimeter-wave rat-race balun; phase-inverter; size 28 nm; slow-wave coplanar waveguide transmission lines; CMOS integrated circuits; Couplers; Impedance matching; Insertion loss; Microwave circuits; Microwave integrated circuits; Propagation losses; Balun; millimeter- wave devices; rat-race coupler;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Workshop Series on Millimeter Wave Integration Technologies (IMWS), 2011 IEEE MTT-S International
Conference_Location :
Sitges
Print_ISBN :
978-1-61284-963-8
Type :
conf
DOI :
10.1109/IMWS3.2011.6061891
Filename :
6061891
Link To Document :
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