Title :
A new simultaneous conducted electromagnetic interference measuring and testing device
Author :
Sakulhirirak, D. ; Tarateeraseth, V. ; Khan-ngern, Werachet ; Yoothanom, N.
Author_Institution :
Fac. of Eng., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok
Abstract :
This paper presents a new device for testing and investigating conducted disturbances with simultaneous key parameter measurements. The common and differential modes form line and neutral are simultaneously measured to provide the proper common and differential modes levels. Design techniques for a line impedance stabilization network are focused on the improvement of air core inductor design for high self resonant frequency response, and the electromagnetic interference separation, realized using the S-parameter. The measurement results not only via the good agreement of output impedance and insertion loss of the proposed LISN according to CISPR 16-1, but also via the characteristics of the electromagnetic interference separation.
Keywords :
S-parameters; circuit testing; electric noise measurement; electromagnetic interference; test equipment; S-parameter; device measurement; device testing; differential mode levels; electromagnetic interference; insertion loss; line impedance stabilization network; self resonant frequency response; Circuits; Delta modulation; Electromagnetic interference; Electromagnetic measurements; Impedance measurement; Loss measurement; Probes; Radio frequency; Resistors; Testing;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559948
