DocumentCode
2072512
Title
TEM cell testing of cable noise reduction techniques from 2 MHz to 200 MHz — Part 1
Author
Bradley, Arthur T. ; Evans, William C. ; Reed, Joshua L. ; Shimp, Samuel K., III ; Fitzpatrick, Fred D.
Author_Institution
NASA Langley Res. Center, Hampton, VA
fYear
2008
fDate
19-23 May 2008
Firstpage
610
Lastpage
613
Abstract
This paper presents empirical results of cable noise reduction techniques as demonstrated in a TEM cell operating with radiated fields from 2 - 200 MHz. It is the first part of a two-paper series. This first paper discusses cable types and shield connections. In the second paper, the effects of load and source resistances and chassis connections are examined. For each topic, well established theories are compared to data from a real-world physical system. Finally, recommendations for minimizing cable susceptibility (and thus cable emissions) are presented.
Keywords
TEM cells; cable shielding; cable testing; electromagnetic shielding; TEM cell testing; cable emission; cable noise reduction techniques; cable shield connection; cable susceptibility; chassis connections; frequency 2 MHz to 200 MHz; load resistances; source resistances; Cable shielding; Cables; Electromagnetic compatibility; Frequency; Length measurement; Noise reduction; Pollution measurement; TEM cells; Testing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-981-08-0629-3
Electronic_ISBN
978-981-08-0629-3
Type
conf
DOI
10.1109/APEMC.2008.4559949
Filename
4559949
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