Title :
TEM cell testing of cable noise reduction techniques from 2 MHz to 200 MHz — Part 1
Author :
Bradley, Arthur T. ; Evans, William C. ; Reed, Joshua L. ; Shimp, Samuel K., III ; Fitzpatrick, Fred D.
Author_Institution :
NASA Langley Res. Center, Hampton, VA
Abstract :
This paper presents empirical results of cable noise reduction techniques as demonstrated in a TEM cell operating with radiated fields from 2 - 200 MHz. It is the first part of a two-paper series. This first paper discusses cable types and shield connections. In the second paper, the effects of load and source resistances and chassis connections are examined. For each topic, well established theories are compared to data from a real-world physical system. Finally, recommendations for minimizing cable susceptibility (and thus cable emissions) are presented.
Keywords :
TEM cells; cable shielding; cable testing; electromagnetic shielding; TEM cell testing; cable emission; cable noise reduction techniques; cable shield connection; cable susceptibility; chassis connections; frequency 2 MHz to 200 MHz; load resistances; source resistances; Cable shielding; Cables; Electromagnetic compatibility; Frequency; Length measurement; Noise reduction; Pollution measurement; TEM cells; Testing; Wires;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559949