Title :
Bayesian reliability assessment of electronic equipment under fuzzy sample information
Author :
Zong-run, Yin ; Jun-shan, Li
Author_Institution :
Xi´´an Res. Inst. of Hi-Tech, Hongqing Town, China
Abstract :
Aiming at the fuzzy sample information in Bayesian reliability assessment of electronic equipment, this paper propose a new method based on cut set to describe the fuzziness, deduce the fuzzy operation equations, and generalize the Bayes´ Theory to fuzzy computation area. A practical example is given as an illustration. Result shows that, this approach properly describe the fuzziness transmitting process of data in Bayesian reliability assessment, overcome the operation difficulty of traditional method, and broaden the application field of Bayes method in reliability assessment area.
Keywords :
Bayes methods; fuzzy set theory; reliability; Bayes method; Bayes theory; Bayesian reliability assessment area; electronic equipment; fuzziness; fuzzy computation area; fuzzy operation equations; fuzzy sample information; Decision support systems; Electrical engineering; Transportation; Bayes method; electronic equipment; fuzzy sample; reliability;
Conference_Titel :
Transportation, Mechanical, and Electrical Engineering (TMEE), 2011 International Conference on
Conference_Location :
Changchun
Print_ISBN :
978-1-4577-1700-0
DOI :
10.1109/TMEE.2011.6199384