Title :
TEM Cell Testing of Cable Noise Reduction Techniques from 2 MHz to 200 MHz — Part 2
Author :
Bradley, Arthur T. ; Evans, William C. ; Reed, Joshua L. ; Shimp, Samuel K., III ; Fitzpatrick, Fred D.
Author_Institution :
NASA Langley Res. Center, Hampton, VA
Abstract :
This paper presents empirical results of cable noise reduction techniques as demonstrated in a TEM cell operating with radiated fields from 2 - 200 MHz. It is the second part of a two-paper series. The first paper discussed cable types and shield connections. In this second paper, the effects of load and source resistances and chassis connections are examined. For each topic, well established theories are compared to data from a real-world physical system. Finally, recommendations for minimizing cable susceptibility (and thus cable emissions) are presented.
Keywords :
TEM cells; circuit noise; electromagnetic compatibility; electronic equipment testing; TEM cell testing; cable noise reduction techniques; capacitive noise coupling; electromagnetic compatibility; frequency 2 MHz to 200 MHz; inductive noise coupling; simplified inductive-capacitive model; Cable shielding; Circuit noise; Coupling circuits; Crosstalk; Electromagnetic compatibility; Noise generators; Noise reduction; TEM cells; Testing; Voltage;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559950