Title :
AC and DC electromigration in aluminum
Author_Institution :
Poughkeepsie, NY, USA
Abstract :
Results are presented for experiments in which aluminum model contact asperity junctions are operated at current density up to 10/sup 6/ A/cm/sup 2/ with either DC or AC square wave current. Application of current as a square wave eliminates the possible influence of cyclic thermal stresses which could have been a factor in a previous study. Electromigration failure, observed as a relatively abrupt increase of resistance, occurs in both AC and DC specimens. Conditions under which electromigration deterioration may occur in practical aluminum power connections are discussed.
Keywords :
aluminium; electrical contacts; electromigration; AC electromigration; Al; DC electromigration; aluminum contact; asperity junction; current density; failure; power connection; square wave current; Aluminum oxide; Conductors; Connectors; Contacts; Current density; Electromigration; Fasteners; Insulation; Thermal stresses; Wire;
Conference_Titel :
Electrical Contacts, 1996. Proceedings of the Forty-Second IEEE Holm Conference on ??. Joint with the 18th International Conference on Electrical Contacts
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-3578-3
DOI :
10.1109/HOLM.1996.557211
