DocumentCode
2072911
Title
Design of a clock jitter reduction circuit using gated phase blending between self-delayed clock edges
Author
Niitsu, Kiichi ; Harigai, Naohiro ; Hirabayashi, Daiki ; Oki, D. ; Sakurai, Masaru ; Kobayashi, Osamu ; Yamaguchi, Takahiro J. ; Kobayashi, Hideo
Author_Institution
Gunma Univ., Kiryu, Japan
fYear
2013
fDate
22-25 Jan. 2013
Firstpage
103
Lastpage
104
Abstract
Design of a clock jitter reduction circuit that exploits the phase blending technique between the uncorrelated clock edges that are self-delayed by multiples of the clock cycle, nT is presented. By blending uncorrelated clock edges, the output clock edges approach the ideal timing and, thus, timing jitter can be reduced by a factor of √2 per stage. There are three technical challenges to realize this: 1) generating uncorrelated clock edges, 2) phase averaging with small time offset from the ideal center position, and 3) minimizing the error in nT-delay being deviated from ideal nT. The proposed circuit overcomes each of these by exploiting an nT-delay, gated phase blending, and self-calibrated nT-delay elements, respectively. Measurement results with a 180-nm CMOS prototype chip demonstrated an approximately four-fold reduction in timing jitter from 30.2 ps to 8.8 ps in 500-MHz clock by cascading the proposed circuit with four-stages.
Keywords
CMOS digital integrated circuits; clocks; digital circuits; timing jitter; CMOS prototype chip; clock jitter reduction circuit design; four-fold reduction; frequency 500 MHz; gated phase blending; self-delayed clock edges; size 180 nm; time 30.2 ps to 8.8 ps; timing jitter; uncorrelated clock edges; Clocks; Delays; Logic gates; Phase measurement; Semiconductor device measurement; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4673-3029-9
Type
conf
DOI
10.1109/ASPDAC.2013.6509577
Filename
6509577
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