Title :
Design of a clock jitter reduction circuit using gated phase blending between self-delayed clock edges
Author :
Niitsu, Kiichi ; Harigai, Naohiro ; Hirabayashi, Daiki ; Oki, D. ; Sakurai, Masaru ; Kobayashi, Osamu ; Yamaguchi, Takahiro J. ; Kobayashi, Hideo
Author_Institution :
Gunma Univ., Kiryu, Japan
Abstract :
Design of a clock jitter reduction circuit that exploits the phase blending technique between the uncorrelated clock edges that are self-delayed by multiples of the clock cycle, nT is presented. By blending uncorrelated clock edges, the output clock edges approach the ideal timing and, thus, timing jitter can be reduced by a factor of √2 per stage. There are three technical challenges to realize this: 1) generating uncorrelated clock edges, 2) phase averaging with small time offset from the ideal center position, and 3) minimizing the error in nT-delay being deviated from ideal nT. The proposed circuit overcomes each of these by exploiting an nT-delay, gated phase blending, and self-calibrated nT-delay elements, respectively. Measurement results with a 180-nm CMOS prototype chip demonstrated an approximately four-fold reduction in timing jitter from 30.2 ps to 8.8 ps in 500-MHz clock by cascading the proposed circuit with four-stages.
Keywords :
CMOS digital integrated circuits; clocks; digital circuits; timing jitter; CMOS prototype chip; clock jitter reduction circuit design; four-fold reduction; frequency 500 MHz; gated phase blending; self-delayed clock edges; size 180 nm; time 30.2 ps to 8.8 ps; timing jitter; uncorrelated clock edges; Clocks; Delays; Logic gates; Phase measurement; Semiconductor device measurement; Timing jitter;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4673-3029-9
DOI :
10.1109/ASPDAC.2013.6509577