DocumentCode :
2073072
Title :
Dependable VLSI Platform using Robust Fabrics
Author :
Onodera, Hidetoshi
Author_Institution :
Dept. Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
fYear :
2013
fDate :
22-25 Jan. 2013
Firstpage :
119
Lastpage :
124
Abstract :
Technology scaling and growing complexity have an increasing impact on the resilience of VLSI circuits and systems. Severe challenges have been emerging for the realization of dependable VLSI circuits and systems with necessary and sufficient amount of reliability and security. For coping with the increasing threats on manufacturability, variability, and transient (soft) errors, we have been working on the development of “Dependable VLSI Platform using Robust Fabrics.” The project tackles the challenges with collaborative researches on layout, circuit, architecture, and design automation. Overview of the project as well as key achievements on the component-level (Fabrics) and the architecture-level (reconfigurable architecture) will be explained, followed by a brief introduction of the platform SoC and its C-based design tools.
Keywords :
VLSI; electronic design automation; integrated circuit layout; integrated circuit reliability; radiation hardening (electronics); reconfigurable architectures; system-on-chip; C-based design tools; VLSI platform; design automation; integrated circuit layout; integrated circuit reliability; platform SoC; reconfigurable architecture; robust fabrics; soft errors; technology scaling; transient errors; Arrays; Clocks; Resilience; Robustness; Tunneling magnetoresistance; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4673-3029-9
Type :
conf
DOI :
10.1109/ASPDAC.2013.6509583
Filename :
6509583
Link To Document :
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