DocumentCode :
2073098
Title :
PEEL modeling and reduction studies based on nonuniform mesh and Arnoldi algorithm
Author :
Qijun, Pan ; Weiming, Ma ; Zhihua, Zhao ; Jin, Meng ; Lei, Zhang ; Jian, Tang
Author_Institution :
Res. Inst. of Power Electron. Technol., Naval Univ. of Eng., Wuhan
fYear :
2008
fDate :
19-23 May 2008
Firstpage :
714
Lastpage :
717
Abstract :
With the increase of the conductor dimensions and the considered frequencies, the effective mesh and model reduction approaches must be studied. Based on the current distribution regularity of a conductor, this paper puts forward a novel multi-skin depth non-uniform mesh method (MSDNMM). Then, the intrinsic numerical ill-conditioning of asymptotic waveform evaluation (AWE) reduction method is pointed out due to the direct moment matching. Furthermore, Arnoldi algorithm is proposed to reduce the high-order original system. The new algorithm transfers the moment direct explicit computation to indirect implicit calculation. Finally, the resistances and inductances of the reduced branches with skin effect is obtained independent of frequencies, which is validated by examples.
Keywords :
conductors (electric); current distribution; mesh generation; Arnoldi algorithm; PEEL modeling; asymptotic waveform evaluation reduction method; conductor dimensions; current distribution regularity; direct moment matching; high-order original system; intrinsic numerical ill-conditioning; model reduction; multi-skin depth nonuniform mesh method; nonuniform mesh; Conductors; Current density; Current distribution; Electromagnetic compatibility; Frequency; Iterative algorithms; Large-scale systems; Power electronics; Power engineering and energy; Reduced order systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
Type :
conf
DOI :
10.1109/APEMC.2008.4559975
Filename :
4559975
Link To Document :
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