Title :
Integrated spectrometers for spectral-domain optical coherence tomography
Author :
Akca, B.I. ; Nguyen, V.D. ; Kalkman, J. ; Van Leeuwen, T.G. ; Wörhoff, K. ; de Ridder, R.M. ; Pollnau, M.
Author_Institution :
Integrated Opt. Microsyst. Group, Univ. of Twente, Enschede, Netherlands
Abstract :
In this work, the authors present the design and fabrication of arrayed waveguide gratings (AWGs) at 800 and 1300 nm as these wavelengths are commonly applied to retina and skin imaging, respectively. We perform interferometric depth ranging measurements with AWG spectrometers in a spectral-domain OCT (SD-OCT) set-up thus demonstrating the first important step toward miniaturization of an OCT system in silicon-oxynitride (SiON) for the 800-nm and 1300-nm spectral ranges.
Keywords :
arrayed waveguide gratings; eye; optical tomography; silicon compounds; spectrometers; AWG spectrometers; SiON; arrayed waveguide gratings; integrated spectrometers; interferometric depth ranging measurements; retina; silicon-oxynitride; skin imaging; spectral-domain optical coherence tomography; wavelength 1300 nm; wavelength 800 nm; Image resolution; Lenses; Optical imaging;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5943240