DocumentCode
2073162
Title
Optimizing multi-level combinational circuits for generating random bits
Author
Chen Wang ; Weikang Qian
Author_Institution
SJTU Joint Inst., Univ. of Michigan, Shanghai, China
fYear
2013
fDate
22-25 Jan. 2013
Firstpage
139
Lastpage
144
Abstract
Random bits are an important construct in many applications, such as hardware-based implementation of probabilistic algorithms and weighted random testing. One approach in generating random bits with required probabilities is to synthesize combinational circuits that transform a set of source probabilities into target probabilities. In [1], the authors proposed a greedy algorithm that synthesizes circuits in the form of a gate chain to approximate target probabilities. However, since this approach only considers circuits of such a special form, the resulting circuits are not satisfactory both in terms of the approximation error and the circuit depth. In this paper, we propose a new algorithm to synthesize combinational circuits for generating random bits. Compared to the previous one, our approach greatly enlarges the search space. Also, we apply a linear property of probabilistic logic computation and an iterative local search method to increase the efficiency of our algorithm. Experimental results comparing the approximation errors and the depths of the circuits synthesized by our method to those of the circuits synthesized by the previous approach demonstrate the superiority of our method.
Keywords
approximation theory; combinational circuits; iterative methods; probability; random processes; approximation error; circuit depth; greedy algorithm; iterative local search method; linear property; multilevel combinational circuit; probabilistic logic computation; random bits; source probability; target probability; Approximation algorithms; Combinational circuits; Equations; Inverters; Iterative methods; Logic gates; Probabilistic logic;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4673-3029-9
Type
conf
DOI
10.1109/ASPDAC.2013.6509586
Filename
6509586
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