Title :
Return loss optimization of the microprocessor package vertical interconnect
Author :
Sathanur, Arun V. ; Jandhyala, Vikram ; Aygün, Kemal ; Braunisch, Henning ; Zhang, Zhichao
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
Abstract :
A geometry based parametric model of a differential high-speed line traversing a ten-layer microprocessor package is developed. This model is used to undertake a detailed study of the effect of the various geometrical parameters on the return loss performance of such a package. The forward problem is solved using a fast, full-wave electromagnetic (EM) solver. The effect of various types of routing in the intermediate layers is examined closely. A sensitivity analysis based on parametric sweeps is carried out to identify the key variables. A hierarchical response surface based optimization is carried out to arrive at an optimum structure. A global optimizer based on simulated annealing is harnessed to find the optimum of non-linear and, in general, non-convex functions. The optimized structure exhibits excellent return loss characteristics translating into higher channel bandwidth.
Keywords :
microprocessor chips; network routing; simulated annealing; full-wave electromagnetic solver; hierarchical response surface-based optimization; microprocessor package vertical interconnect; return loss optimization; routing; simulated annealing; Geometry; Microprocessors; Packaging; Parametric statistics; Performance loss; Response surface methodology; Routing; Sensitivity analysis; Simulated annealing; Solid modeling;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074234