• DocumentCode
    2073468
  • Title

    Return loss optimization of the microprocessor package vertical interconnect

  • Author

    Sathanur, Arun V. ; Jandhyala, Vikram ; Aygün, Kemal ; Braunisch, Henning ; Zhang, Zhichao

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    1636
  • Lastpage
    1642
  • Abstract
    A geometry based parametric model of a differential high-speed line traversing a ten-layer microprocessor package is developed. This model is used to undertake a detailed study of the effect of the various geometrical parameters on the return loss performance of such a package. The forward problem is solved using a fast, full-wave electromagnetic (EM) solver. The effect of various types of routing in the intermediate layers is examined closely. A sensitivity analysis based on parametric sweeps is carried out to identify the key variables. A hierarchical response surface based optimization is carried out to arrive at an optimum structure. A global optimizer based on simulated annealing is harnessed to find the optimum of non-linear and, in general, non-convex functions. The optimized structure exhibits excellent return loss characteristics translating into higher channel bandwidth.
  • Keywords
    microprocessor chips; network routing; simulated annealing; full-wave electromagnetic solver; hierarchical response surface-based optimization; microprocessor package vertical interconnect; return loss optimization; routing; simulated annealing; Geometry; Microprocessors; Packaging; Parametric statistics; Performance loss; Response surface methodology; Routing; Sensitivity analysis; Simulated annealing; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074234
  • Filename
    5074234