DocumentCode :
2073492
Title :
Normality test and characteristic statistic analysis of transient electromagnetic disturbance
Author :
Su, Jingfang ; Zhang, Weidong ; Cui, Xiang ; Zhao, Jie ; Li, Xiaolin ; Wang, Qi
Author_Institution :
Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Baoding
fYear :
2008
fDate :
19-23 May 2008
Firstpage :
782
Lastpage :
785
Abstract :
According to the diversity of transient electromagnetic quantity, typical waveforms and spectrums of switching operation are got in transient disturbance; then, the disturbance characteristic of time and frequency domain are analyzed. Mainly the distribution probability and frequency statistic of characteristic parameter are analyzed. Drawing up probability graph of time-domain and envelope diagram of frequency-domain, continue to analyze. Besides, this paper makes a small sample statistic analysis based on statistic theory, utilizes the methods of normality test, such as normal probability test, W-normality test, D-normality test, kurtosis and skewness test, and compares these test methods to get initial conclusions.
Keywords :
computational electromagnetics; frequency-domain analysis; probability; time-domain analysis; characteristic statistic analysis; distribution probability; frequency domain; frequency-domain frequency-domain; normality test; probability graph; statistic analysis; switching operation; time-domains; transient disturbance; transient electromagnetic disturbance; transient electromagnetic quantity; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic transients; Frequency domain analysis; Probability; Statistical analysis; Statistical distributions; Testing; Time domain analysis; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
Type :
conf
DOI :
10.1109/APEMC.2008.4559992
Filename :
4559992
Link To Document :
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