Title :
Electromagnetic coupling on airborne structures and systems using NEC
Author :
Ying, Wang ; Zheng, Zhong ; Ooi, B.L.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
Modern aircraft are increasingly packed with advanced and often sensitive electronic systems, making them very vulnerable to electromagnetic interference. Furthermore, the growing communication arena adds rapidly into the environment high power transmitters that produce field strength in excess of a 100 V/m in the vicinity of aircraft flight paths, rendering particularly the high power HF a real hazard to the flying aircraft with dimensions being within the resonant band of HIT. This paper presents a quantitative approach to analyze this coupling mechanism. The feasibility of using NEC wire-grid scheme for analyzing field penetration into enclosures and interior cabling has been established for the first time. A full NEC wire-grid model of a fighter aircraft is developed and used extensively for simulation in support of theoretical predictions. Practical results and numerical insights, which are useful for aircraft engineers, are obtained directly on penetrating fields and cable coupling with different polarizationpsilas and frequencies both near and off resonance.
Keywords :
aircraft; electromagnetic coupling; electromagnetic interference; NEC wire-grid scheme; airborne structures; electromagnetic coupling; electromagnetic interference; electronic systems; field penetration; fighter aircraft; high power transmitters; Aerospace electronics; Aircraft propulsion; Electromagnetic coupling; Electromagnetic interference; Hazards; Military aircraft; National electric code; Predictive models; Resonance; Transmitters; Airborne structures; Electromagnetic Coupling;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4559993