• DocumentCode
    2073604
  • Title

    Electrostatics of nanowire transistors

  • Author

    Guo, Jing ; Wang, Jing ; Polizzi, Eric ; Datta, Supriyo ; Lundstrom, Mark

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    12-14 Aug. 2003
  • Firstpage
    248
  • Abstract
    The charge transfer doping in metal wire-carbon nanotube junctions has been demonstrated to be important before. In this paper, we investigate the effect of contact geometry, metal work function and insulator dielectric constant on the charge transfer doping into a nanowire channel. We then explore the effect of charge transfer doping on the operation of nanowire transistors. We show that the nanowire transistors with large gate underlap can still deliver an appreciable amount of on-current, which provides a possible explanation for a recent experiment by Javey et al. At the same time, charge transfer doping also imposes constraints on the transistor design.
  • Keywords
    MIM structures; carbon nanotubes; dielectric materials; field effect transistors; nanotube devices; nanowires; permittivity; semiconductor device models; work function; C; charge transfer doping; electrostatics; insulator dielectric constant; metal work function; nanowire channel; nanowire transistors; Carbon nanotubes; Charge transfer; Coaxial components; Dielectric constant; Dielectrics and electrical insulation; Electrodes; Electrostatics; Geometry; Metal-insulator structures; Semiconductor device doping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
  • Print_ISBN
    0-7803-7976-4
  • Type

    conf

  • DOI
    10.1109/NANO.2003.1231762
  • Filename
    1231762