Title :
Automated EEG inter-burst interval detection in neonates with mild to moderate postasphyxial encephalopathy
Author :
Matic, Vladimir ; Cherian, P.J. ; Jansen, Katrien ; Koolen, Ninah ; Naulaers, Gunnar ; Swarte, R.M. ; Govaert, P. ; Visser, G.H. ; Van Huffel, Sabine ; De Vos, Maarten
Author_Institution :
Dept. of Electr. Eng. (ESAT-SCD), Katholieke Univ. Leuven, Leuven, Belgium
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
EEG inter-burst interval (IBI) and its evolution is a robust parameter for grading hypoxic encephalopathy and prognostication in newborns with perinatal asphyxia. We present a reliable algorithm for the automatic detection of IBIs. This automated approach is based on adaptive segmentation of EEG, classification of segments and use of temporal profiles to describe the global distribution of EEG activity. A pediatric neurologist has blindly scored data from 8 newborns with perinatal postasphyxial encephalopathy varying from mild to severe. 15 minutes of EEG have been scored per patient, thus totaling 2 hours of EEG that was used for validation. The algorithm shows good detection accuracy and provides insight into challenging cases that are difficult to detect.
Keywords :
electroencephalography; medical disorders; medical signal processing; neurophysiology; paediatrics; signal classification; EEG classification; adaptive segmentation; automated EEG interburst interval detection; hypoxic encephalopathy; mild; neonates; pediatric neurologist; perinatal asphyxia; perinatal postasphyxial encephalopathy; prognostication; robust parameter; temporal profiles; Classification algorithms; Educational institutions; Electroencephalography; Hospitals; Monitoring; Pediatrics; Reliability; Algorithms; Asphyxia Neonatorum; Automatic Data Processing; Brain Diseases; Electroencephalography; Female; Humans; Infant, Newborn; Male; Sensitivity and Specificity; Severity of Illness Index; Signal Processing, Computer-Assisted;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6345860