Surface phenomena at metal-carbon nanotube interfaces

Recent advances in the synthesis techniques of metallic carbon nanotubes (CNTs) for use as quantum wires and interconnects have facilitated the need for proper characterization of these devices. In this paper we compare the variety of different configurations that may be suitable for future on-chip interconnect applications. We study various mechanisms of electron transport in traditional metal and metal-CNT systems that give rise to contact resistance (R_C). We also examine results of recent studies of DC characteristics exhibiting varying values for CNT conductance, and discuss surface phenomena that may explain these different behaviors.