Title :
A tiny plastic package of pressure sensors fabricated using the lithographic dam-ring approach
Author :
Lung-Tai Chen ; Hsu, Chung-Yi ; Chang, Jin-Sgeng ; Chu, Chun-Hsun ; Cheng, Woo-Hi ; Xie, Yue-Zhe ; Chen, R.S.
Author_Institution :
Micro-Syst. Technol. Center, ITRI
Abstract :
This study presents a novel plastic package for piezoresistive pressure sensors. A photoresist dam-ring patterned using the lithographic process is spin-coated on a piezoresistive pressure sensor to define a sensing channel in the pressure sensor package. Fluid epoxy molding encapsulates the pressure sensor and exposes the sensing channel during a high-temperature molding process at 165degC. Experimental observations reveal that the silicon membrane of the pressure sensor is completely free of epoxy molding compound (EMC) contamination after the transfer molding process. The effectiveness of the dam-ring in shielding the silicon membrane of the pressure sensor during the molding process was confirmed. The packaged pressure sensor exerts a thermo-mechanical stress on the silicon membrane of the pressure sensor, resulting in an undesired output voltage drift. However, employing a package design with a large sensing channel opening can reduce the effect of package-induced stress. The proposed packaging scheme was a small package volume and surface-mount device (SMD) compatible features, making it suitable for portable commercial devices.
Keywords :
membranes; photoresists; piezoresistive devices; plastic packaging; pressure sensors; silicon; spin coating; surface mount technology; transfer moulding; Si; epoxy molding compound; fluid epoxy molding encapsulation; lithographic process; patterned photoresist dam-ring; piezoresistive pressure sensors; plastic package; pressure sensor package; silicon membrane; spin-coating; surface-mount device; temperature 165 degC; thermo-mechanical stress; transfer molding process; Biomembranes; Contamination; Electromagnetic compatibility; Piezoresistance; Plastic packaging; Resists; Silicon; Thermal sensors; Thermal stresses; Transfer molding;
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2009.5074240