DocumentCode :
2073812
Title :
Comparison of joint level impact fatigue resistance and board level drop test
Author :
Guruprasad, Pradosh ; Pitarresi, James
Author_Institution :
Dept. of Mech. Eng., State Univ. of New York, Binghamton, NY
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
1708
Lastpage :
1713
Abstract :
The purpose of the present study is to investigate the behavior of solder joints under high strain rate repeated loading during micro-impact testing. SAC 105 and SAC 305 solder alloys on electrolytic nickel-gold and copper-OSP pads were used in this study. In doing so, the dependency on factors such as impact energy and solder alloy was studied.In terms of solder alloy, lower silver containing tin-silver-copper based alloys are beneficial in high strain rate cyclic loading due to the increased ductility of the alloy. The majority of the failures observed on the SAC305 assemblies were intermetallic fracture, while the SAC 105 assemblies exhibited mostly solder failure modes. As the strain rate decreased, failure modes transitioned from brittle to ductile failure for the SAC305 assemblies. This transition was not the same for the two alloys. Reliability in board-level drop testing was compared to the results obtained from the micro-impact fatigue testing. Assemblies built using SAC 105 tended to outlast SAC305 assemblies, due to the increased ductility of the lower Ag containing solder. Failure modes correlated well between drop testing and joint level impact fatigue testing. It was found that the impact energy was a useful metric in determining the reliability of the solder joint.
Keywords :
copper alloys; failure analysis; fatigue; fracture; gold; impact (mechanical); nickel; reliability; silver alloys; soldering; tin alloys; Ni-Au; SAC 105 solder alloys; SAC 305 solder alloys; SAC305 assembly; SnAgCuJk; board level drop test; copper-OSP pads; cyclic loading; ductile failure; electrolytic nickel-gold pads; failures; impact energy; intermetallic fracture; joint level impact fatigue resistance; joint level impact fatigue testing; microimpact testing; reliability; solder failure modes; solder joints; strain rate; tin-silver-copper-based alloys; Assembly; Capacitive sensors; Copper alloys; Electrical resistance measurement; Electronic equipment testing; Fatigue; Intermetallic; Mechanical engineering; Metallization; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074245
Filename :
5074245
Link To Document :
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