DocumentCode :
2073847
Title :
Selectively protecting error-correcting code for area-efficient and reliable STT-RAM caches
Author :
Junwhan Ahn ; Sungjoo Yoo ; Kiyoung Choi
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear :
2013
fDate :
22-25 Jan. 2013
Firstpage :
285
Lastpage :
290
Abstract :
Recent researches on STT-RAM revealed that device scaling makes its write operations unreliable. To mitigate the impact of this problem, this paper proposes a low-cost, ECC-based solution for STT-RAM caches. In particular, it proposes to share storage for ECC among different blocks within a set and to use them only for unsuccessful write operations. Experimental results show that our scheme reduces 74% to 98% of area overhead incurred by the conventional per-block ECC while maintaining system performance and reliability.
Keywords :
cache storage; error correction codes; integrated circuit reliability; random-access storage; STT-RAM; area-efficient STT-RAM caches; low-cost ECC-based solution; reliable STT-RAM caches; selectively protecting error-correcting code; spin-transfer torque RAM; Arrays; Bit error rate; Energy consumption; Error correction; Error correction codes; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4673-3029-9
Type :
conf
DOI :
10.1109/ASPDAC.2013.6509610
Filename :
6509610
Link To Document :
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