DocumentCode
2073847
Title
Selectively protecting error-correcting code for area-efficient and reliable STT-RAM caches
Author
Junwhan Ahn ; Sungjoo Yoo ; Kiyoung Choi
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear
2013
fDate
22-25 Jan. 2013
Firstpage
285
Lastpage
290
Abstract
Recent researches on STT-RAM revealed that device scaling makes its write operations unreliable. To mitigate the impact of this problem, this paper proposes a low-cost, ECC-based solution for STT-RAM caches. In particular, it proposes to share storage for ECC among different blocks within a set and to use them only for unsuccessful write operations. Experimental results show that our scheme reduces 74% to 98% of area overhead incurred by the conventional per-block ECC while maintaining system performance and reliability.
Keywords
cache storage; error correction codes; integrated circuit reliability; random-access storage; STT-RAM; area-efficient STT-RAM caches; low-cost ECC-based solution; reliable STT-RAM caches; selectively protecting error-correcting code; spin-transfer torque RAM; Arrays; Bit error rate; Energy consumption; Error correction; Error correction codes; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4673-3029-9
Type
conf
DOI
10.1109/ASPDAC.2013.6509610
Filename
6509610
Link To Document