• DocumentCode
    2073847
  • Title

    Selectively protecting error-correcting code for area-efficient and reliable STT-RAM caches

  • Author

    Junwhan Ahn ; Sungjoo Yoo ; Kiyoung Choi

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    285
  • Lastpage
    290
  • Abstract
    Recent researches on STT-RAM revealed that device scaling makes its write operations unreliable. To mitigate the impact of this problem, this paper proposes a low-cost, ECC-based solution for STT-RAM caches. In particular, it proposes to share storage for ECC among different blocks within a set and to use them only for unsuccessful write operations. Experimental results show that our scheme reduces 74% to 98% of area overhead incurred by the conventional per-block ECC while maintaining system performance and reliability.
  • Keywords
    cache storage; error correction codes; integrated circuit reliability; random-access storage; STT-RAM; area-efficient STT-RAM caches; low-cost ECC-based solution; reliable STT-RAM caches; selectively protecting error-correcting code; spin-transfer torque RAM; Arrays; Bit error rate; Energy consumption; Error correction; Error correction codes; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509610
  • Filename
    6509610